光学
显微镜
景深
反射(计算机编程)
显微镜
像素
材料科学
振膜(声学)
光学显微镜
薄层荧光显微镜
不透明度
光圈(计算机存储器)
计算机科学
物理
扫描共焦电子显微镜
扫描电子显微镜
声学
扬声器
程序设计语言
作者
Manhong Yao,Jiajian Cheng,Zhuobin Huang,Zibang Zhang,Shiping Li,Junzheng Peng,Jingang Zhong
出处
期刊:Optics Express
[Optica Publishing Group]
日期:2019-10-28
卷期号:27 (23): 33040-33040
被引量:10
摘要
Reflected light microscope is a tool for imaging opaque specimens. However, most of the existing reflected light microscopes can only obtain the two-dimensional image of the specimen. Here we demonstrate that with the help of single-pixel imaging, we can develop a reflection light-field microscopy for volumetric imaging. Importantly, using single-pixel imaging, we can digitally adjust the size of the aperture diaphragm of the proposed reflection light-field microscope for changing the depth of field and for achieving three-dimensional differential phase-contrast imaging in an arbitrary direction, without a hardware change. Our approach may benefit various reflective specimens with wide depth information in the semiconductor industry and material science.
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