材料科学
氧化铟锡
光电子学
铟
电极
钙钛矿(结构)
薄板电阻
透明导电膜
兴奋剂
氧化物
串联
结晶度
薄膜
纳米技术
化学工程
复合材料
图层(电子)
冶金
物理化学
工程类
化学
作者
Erkan Aydın,Michele De Bastiani,Xinbo Yang,Muhammad Sajjad,Faisal Aljamaan,Yury Smirnov,Mohamed Nejib Hedhili,Wenzhu Liu,Thomas G. Allen,Lujia Xu,Emmanuel Van Kerschaver,Monica Morales‐Masis,Udo Schwingenschlögl,Stefaan De Wolf
标识
DOI:10.1002/adfm.201901741
摘要
Abstract Parasitic absorption in transparent electrodes is one of the main roadblocks to enabling power conversion efficiencies (PCEs) for perovskite‐based tandem solar cells beyond 30%. To reduce such losses and maximize light coupling, the broadband transparency of such electrodes should be improved, especially at the front of the device. Here, the excellent properties of Zr‐doped indium oxide (IZRO) transparent electrodes for such applications, with improved near‐infrared (NIR) response, compared to conventional tin‐doped indium oxide (ITO) electrodes, are shown. Optimized IZRO films feature a very high electron mobility (up to ≈77 cm 2 V −1 s −1 ), enabling highly infrared transparent films with a very low sheet resistance (≈18 Ω □ −1 for annealed 100 nm films). For devices, this translates in a parasitic absorption of only ≈5% for IZRO within the solar spectrum (250–2500 nm range), to be compared with ≈10% for commercial ITO. Fundamentally, it is found that the high conductivity of annealed IZRO films is directly linked to promoted crystallinity of the indium oxide (In 2 O 3 ) films due to Zr‐doping. Overall, on a four‐terminal perovskite/silicon tandem device level, an absolute 3.5 mA cm −2 short‐circuit current improvement in silicon bottom cells is obtained by replacing commercial ITO electrodes with IZRO, resulting in improving the PCE from 23.3% to 26.2%.
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