薄膜晶体管
材料科学
晶体管
退火(玻璃)
溶解过程
原子层沉积
硅
电介质
薄膜
电极
光电子学
基质(水族馆)
图层(电子)
化学工程
纳米技术
电气工程
电压
化学
复合材料
海洋学
工程类
物理化学
地质学
作者
Young‐Jin Kwack,Thi Thu Thuy Can,Woon‐Seop Choi
标识
DOI:10.1038/s41699-021-00264-7
摘要
A bottom-up water-based solution-process method was developed for atomic layered MoS 2 with a one-step annealing process and no sulfurization. The chosen MoS 2 precursor is water soluble and was carefully formulated to obtain good coating properties on a silicon substrate. The coated precursor was annealed in a furnace one time to crystallize it. This method can obtain a large and uniform atomic layer of 2D MoS 2 with 2H lattice structure. The number of atomic layers (4–7) was controlled through the precursor concentrations and showed good uniformity, which was confirmed by STEM and AFM. Four types of thin-film transistors (TFTs) were prepared from the solution-processed MoS 2 on Al 2 O 3 and SiO 2 dielectric with either thermal evaporated Al or printed Ag source and drain electrodes. The best result shows an improved mobility of 8.5 cm 2 V −1 s −1 and a reasonable on–off ratio of about 1.0 × 10 5 with solid output saturation.
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