光电效应
碳纳米管
材料科学
导电原子力显微镜
波长
光电子学
原子力显微镜
扫描电子显微镜
激发态
纳米技术
退火(玻璃)
图层(电子)
分析化学(期刊)
复合材料
化学
物理
原子物理学
有机化学
作者
Yawar Abbas,M. Baker,Moh’d Rezeq
标识
DOI:10.1109/nano54668.2022.9928657
摘要
Detailed investigations for the photoelectric characteristics of a single-layer of carbon nanotubes (CNTs) have been performed using a conductive mode atomic force microscope (CAFM). The diluted CNTs were drop-casted on a SiO 2 /n-Si substrate followed by annealing in N 2 ambient for 2 hours at 70°C. Individual CNTs were identified using the AC imaging mode of atomic force microscope (AFM). Subsequently, the electrical measurements were performed using CAFM with an Au-coated tip placed directly on the CNTs. A lower turn-on voltage is observed for the shorter wavelength of light illuminated on the CNTs, compared to that of a long light wavelength, indicating higher energy electrons are excited to the conduction band of the CNT.
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