消散
模具(集成电路)
电压
功率(物理)
电压降
电子工程
电气工程
材料科学
瞬态(计算机编程)
电子设备和系统的热管理
电源完整性
噪音(视频)
工程类
计算机科学
机械工程
物理
信号完整性
印刷电路板
图像(数学)
人工智能
操作系统
热力学
量子力学
作者
Yang Zhang,Muhannad S. Bakir
出处
期刊:IEEE Transactions on Components, Packaging and Manufacturing Technology
[Institute of Electrical and Electronics Engineers]
日期:2017-02-14
卷期号:7 (3): 434-443
被引量:9
标识
DOI:10.1109/tcpmt.2017.2657382
摘要
This paper presents a thermal and power delivery network (PDN) co-simulation framework for single-die and emerging multi-die configurations that incorporates the interactions between temperature, supply voltage, and power dissipation. The temperature dependencies of wire resistivity and leakage power are considered, and the supply voltage dependencies of power dissipation are modeled. Starting with a reference power dissipation, the framework is capable of evaluating the temperature distribution and PDN noise simultaneously and eventually updating the power dissipation based on the thermal and supply voltage distributions. The simulation results of an example two-tier 3-D stack show that prior models considering only part of the interactions between temperature, supply voltage, and power dissipation have a maximum error of 7.66%, 9.79%, and 4.64% in IR-drop, transient power supply noise, and temperature, respectively.
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