碳纳米管
纳米技术
材料科学
纳米管
显微镜
化学气相沉积
原子力显微镜
扫描探针显微镜
制作
限制
硅
分辨率(逻辑)
光学
光电子学
物理
医学
机械工程
替代医学
工程类
病理
人工智能
计算机科学
作者
Jason H. Hafner,Chin Li Cheung,Charles M. Lieber
出处
期刊:Nature
[Springer Nature]
日期:1999-04-01
卷期号:398 (6730): 761-762
被引量:378
摘要
Carbon nanotubes, which have intrinsically small diameters and high aspect ratios and which buckle reversibly, make potentially ideal structures for use as tips in scanning probe microscopies, such as atomic force microscopy (AFM)1,2,3,4. However, the present method of mechanically attaching nanotube bundles for tip fabrication is time consuming and selects against the smallest nanotubes, limiting the quality of tips. We have developed a technique for growing individual carbon nanotube probe tips directly, with control over the orientation, by chemical vapour deposition (CVD) from the ends of silicon tips. Tips grown in this way may become widely used in high-resolution probe microscopy imaging.
科研通智能强力驱动
Strongly Powered by AbleSci AI