薄脆饼
生物医学中的光声成像
材料科学
半导体
光电子学
半导体材料
显微镜
光学
物理
作者
M. Kasai,Tsuguo Sawada,Yohichi Gohshi
标识
DOI:10.7567/jjaps.24s1.220
摘要
Non-destructive inspections of some GaAs semiconductor devices were carried using a home-made photoacoustic microscope (PAM). PAM images of a Zn-doped region and dislocations of GaAs wafers were particularly discussed in this paper.
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