外延
薄膜晶体管
材料科学
电子迁移率
光电子学
晶体管
薄膜
霍尔效应
分析化学(期刊)
纳米技术
图层(电子)
化学
电阻率和电导率
电气工程
电压
工程类
色谱法
作者
Kosuke Matsuzaki,Kenji Nomura,Hiroshi Yanagi,Toshio Kamiya,Masahiro Hirano,Hideo Hosono
摘要
Cu 2 O epitaxial films were grown for high mobility p-channel oxide thin-film transistors (TFTs). The use of a (110) MgO surface and fine tuning of a growth condition produced single phase epitaxial films with hole Hall mobilities ∼90 cm2 V−1 s−1 comparable to those of single crystals (∼100 cm2 V−1 s−1). TFTs using the epitaxial film channels exhibited p-channel operation although the field-effect mobilities and the on-to-off current ratio were not yet satisfactory (∼0.26 cm2 V−1 s−1 and ∼6, respectively).
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