硅
薄脆饼
载流子寿命
材料科学
光电子学
兴奋剂
重组
太阳能电池
开路电压
电子迁移率
电压
工程物理
电子工程
电气工程
化学
物理
工程类
生物化学
基因
出处
期刊:Proceedings
日期:2008-07-01
被引量:11
标识
DOI:10.1109/commad.2008.4802135
摘要
Compensated doping is typical of upgraded metallurgical silicon. The relatively low carrier mobility associated to high concentrations of both acceptors and donors leads to paradoxical effects on solar cell performance. While the short-circuit current is expected to decrease compared to non-compensated silicon of the same resistivity, the open-circuit voltage is predicted to increase when bulk recombination is the dominant loss mechanism. On the other hand, surface recombination is predicted to have a greater impact on compensated Si wafers and to result in a lower effective carrier lifetime. These effects are important to understand measurements of compensated Si wafers and devices.
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