微带线
电介质
电容
材料科学
基质(水族馆)
输电线路
计算物理学
数学分析
物理
光学
光电子学
数学
电气工程
工程类
电极
量子力学
海洋学
地质学
作者
P. Benedek,P. Silvester
标识
DOI:10.1109/tmtt.1972.1127861
摘要
The excess charge density distribution near gaps and steps in microstrip transmission lines is calculated by the solution of singular integral equations. Data are presented for gaps in microstrips of width-to-substrate-thickness ratios of 0.5, 1.0, and 2.0 and relative dielectric constants ranging from 1.0 to 15.0. For steps in a microstrip line results are given for width-to-thickness ratio of unity, relative dielectric constants of 1.0 and 9.6, while the change of width-to-height ratio is from 0.1 to 10.0. The excess charges are calculated explicitly in relatively short computing times, and the results are believed to be accurate to within a few percent.
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