Analytical Methods for the Characterization of Aryl Layers

This chapter contains sections titled: Introduction Scanning Probe Microscopies UV–VIS Spectroscopy: Transmission, Re. ection, and Ellipsometry IR Spectroscopy Raman Spectroscopy and Surface-Enhanced Raman Scattering (SERS) X-ray Photoelectron Spectroscopy (XPS) X-ray Standing Waves (XSW) Rutherford Backscattering Time of Flight Secondary Ion Mass Spectroscopy Electrochemistry Contact Angle Measurements Conclusion References