钝化
太阳能电池
材料科学
硅
氧化物
光电子学
晶体硅
图层(电子)
载流子寿命
氧化硅
纳米技术
冶金
氮化硅
作者
Minhan Jeon,Jiyoon Kang,Nagarajan Balaji,Cheolmin Park,Jinsoo Song,Junsin Yi
出处
期刊:Journal of KIEEME
[The Korean Institute of Electrical and Electronic Material Engineers]
日期:2016-06-01
卷期号:29 (6): 321-326
标识
DOI:10.4313/jkem.2016.29.6.321
摘要
Minimizing the carrier recombination and electrical loss through surface passivation is required for high efficiency c-Si solar cell. Usually, $SiN_X$, $SiO_X$, $SiON_X$ and $AlO_X$ layers are used as passivation layer in solar cell application. Silicon oxide layer is one of the good passivation layer in Si based solar cell application. It has good selective carrier, low interface state density, good thermal stability and tunneling effect. Recently tunneling based passivation layer is used for high efficiency Si solar cell such as HIT, TOPCon and TRIEX structure. In this paper, we focused on silicon oxide grown by various the method (thermal, wet-chemical, plasma) and passivation effect in c-Si solar cell.
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