云纹
放大倍数
对称性破坏
对称(几何)
物理
旋转对称性
分子物理学
光学
材料科学
凝聚态物理
几何学
量子力学
数学
机械
作者
Penghong Ci,Yuzhou Zhao,Muhua Sun,Yoonsoo Rho,Yabin Chen,Costas P. Grigoropoulos,Song Jin,Xiaoguang Li,Junqiao Wu
出处
期刊:Nano Letters
[American Chemical Society]
日期:2022-11-08
卷期号:22 (22): 9027-9035
被引量:21
标识
DOI:10.1021/acs.nanolett.2c03347
摘要
Twisted stacking of van der Waals materials with moiré superlattices offers a new way to tailor their physical properties via engineering of the crystal symmetry. Unlike well-studied twisted bilayers, little is known about the overall symmetry and symmetry-driven physical properties of continuously supertwisted multilayer structures. Here, using polarization-resolved second harmonic generation (SHG) microscopy, we report threefold (
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