Electric Field-Dependent Evolution Dynamics of Conductive Filaments in 2D Material-Based Planar Memristors

2D materials have emerged as potential building blocks for electrochemical metallization (ECM) memristors with excellent performance. The evolution dynamics of conductive filaments (CFs) directly determine the resistance switching performance of the 2D material-based ECM memristors. However, achieving controllable CFs under the operation conditions remains challenging. Here, in situ transmission electron microscopy was employed to investigate the formation and evolution of CFs in Au/MoS