A comprehensive understanding of UV-induced degradation of silicon PV modules

This paper provides a comprehensive overview of UV-induced degradation (UVID) in photovoltaic (PV) cells, focusing on its mechanisms, impact on different cell technologies, and potential solutions. UVID, caused by ultraviolet (UV) radiation, leads to material aging and performance decline in PV cells. Recent studies highlight its significant impact on high-efficiency cells like HJT, TOPCon, IBC, and PERC. The primary degradation mechanisms include the breaking of Si-H bonds and the subsequent increase in interface defects and recombination rates, leading to reduced cell efficiency. This paper explores these mechanisms in detail, discussing how different PV technologies are affected and the resulting power losses. It also examines various strategies to mitigate UVID, such as optimizing passivation layers, using UV-cutoff encapsulants, and developing new materials. The findings emphasize the importance of understanding and addressing UVID to enhance the long-term stability and efficiency of PV cells. Establishing comprehensive testing standards and sharing stability data are crucial steps toward developing more reliable PV technologies. This research underscores the need for continued innovation and collaboration in the PV industry to tackle the challenges posed by UVID and ensure sustainable solar energy solutions.