光电探测器
异质结
范德瓦尔斯力
光电子学
量子效率
各向异性
极化(电化学)
材料科学
灵敏度(控制系统)
光学
物理
化学
电子工程
量子力学
分子
工程类
物理化学
作者
Chu Zhou,Jingjing Deng,Jielian Zhang,Jingxian Xiong,Yingxin Yang,Nanshou Wu,Jingbo Li,Sina Li
标识
DOI:10.1021/acs.jpclett.5c02320
摘要
The rapid advancements in optoelectronics and their widespread applications have spurred the development of high-performance photodetectors. This study presents a dual-van der Waals heterostructure photodetector, composed of WSe 2, As 0.6 P 0.4, and WS 2 . It demonstrates outstanding polarization-sensitive light detection without external bias, with a sensitivity of 487 mA/W, a detection capability of 6.09 × 10 11 Jones, and an external quantum efficiency (EQE) of 95% at 635 nm, along with rise/fall times of 18–36 ms. The device also exhibits notable anisotropic polarization sensitivity (4.8 at 405 nm). With its broad spectral coverage (400–1100 nm), fast response, and high sensitivity, this photodetector shows significant promise for imaging applications. The development of anisotropic van der Waals heterojunctions provides a key reference for the design of high-performance, self-powered polarization photodetectors.
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