电阻抗
离散化
频谱泄漏
反问题
介电谱
算法
材料科学
贝叶斯概率
宽带
正规化(语言学)
电压
偏压
数学
电子工程
反向
贝叶斯推理
放松(心理学)
数学分析
先验概率
光谱功率分布
泄漏(经济)
概率分布
反演(地质)
联合概率分布
正多边形
高斯分布
数学优化
声学
分布(数学)
观测误差
计算机科学
高阻抗
计算物理学
数据点
特征向量
作者
Jiapeng Liu,Francesco Ciucci A
标识
DOI:10.1021/acs.jpcc.6c01293
摘要
Conventional electrochemical impedance spectroscopy (EIS) can require hours for broadband frequency sweeps. Broadband time-domain excitations accelerate acquisition, but most workflows reconstruct frequency-domain spectra before applying the distribution of relaxation times (DRT) analysis, introducing spectral leakage and discretization artifacts. We present a convex framework that jointly estimates a shared DRT from impedance data and voltage transients within a single Bayesian formulation, incorporating non-negativity and smoothness priors. Regularization parameters are selected by minimizing a K -fold cross-validation objective with residual-based variance re-estimation, solved via Bayesian optimization. On synthetic circuits with up to two generalized constant-phase elements, the method achieves median DRT errors below 5% and impedance errors below 1%, reducing acquisition time by factors of 4–8 relative to stepped-sine protocols.
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