Ultra high performance of 12kV Clustered Insulated Gate Bipolar Transistor (CIGBT) in 4H-SiC

The performance of a 12kV planar Clustered Insulated Gate Bipolar Transistor (CIGBT) is compared to an equivalent IGBT in 4H-SiC through extensive 2D numerical simulations. The CIGBT shows 40% reduction in Eoff-Vce(sat) trade off losses with a short circuit endurance time of more than 10µs.