钻石
电子
阴极射线
蚀刻(微加工)
电子束诱导沉积
原子物理学
电子转移
氢
材料科学
纳米光刻
梁(结构)
化学
纳米技术
物理
光学
光化学
制作
核物理学
复合材料
有机化学
病理
替代医学
医学
图层(电子)
作者
Marco Fronzi,James Bishop,Aiden A. Martin,M. Hussein N. Assadi,Blake Regan,Catherine Stampfl,Igor Aharonovich,Michael J. Ford,Milos Toth
出处
期刊:Carbon
[Elsevier]
日期:2020-03-29
卷期号:164: 51-58
被引量:10
标识
DOI:10.1016/j.carbon.2020.03.039
摘要
Abstract Electron beam induced etching (EBIE) has recently emerged as a promising direct-write nanofabrication technique. EBIE is typically assumed to proceed entirely through chemical pathways driven by electron-electron interactions. Here we show that knock-on (i.e., momentum transfer from electrons to nuclei) can play a significant role in EBIE, even at electron beam energies as low as 1.5 keV. Specifically, we calculate knock-on cross-sections for H, D, O and CO on the surface of diamond and show experimentally that they affect the kinetics of EBIE performed using oxygen, hydrogen and deuterium etch precursors. Our results advance basic understanding of electron-adsorbate interactions, particularly in relation to EBIE and the related techniques of electron beam-induced deposition and surface functionalisation.
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