光学
X射线光学
物理
几何光学
微通道板探测器
光学(聚焦)
分辨率(逻辑)
角度分辨率(图形绘制)
焦距
X射线
激光器
衍射
探测器
镜头(地质)
组合数学
计算机科学
人工智能
数学
作者
Andrew G. Peele,K. Nugent,Andrei V. Rode,K. Gäbel,M.C. Richardson,Richard R. Strack,Walter P. Siegmund
出处
期刊:Applied optics
[The Optical Society]
日期:1996-08-01
卷期号:35 (22): 4420-4420
被引量:46
摘要
We report an experimental investigation and comparison with simulation of the x-ray focusing of a flat, square profile microchannel plate. We use x rays with an energy of ~1.5 keV from a laser-produced plasma. The images were recorded with x-ray film. We find the focal structure to be consistent with theoretical expectations. The angular resolution of the focus is 0.96 mrad, which is a major improvement over previous results. The measured peak intensity gain is 27 ± 4, which is ~33% of that for a perfect optic.
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