覆盖层
X射线光电子能谱
外延
材料科学
化学计量学
基质(水族馆)
退火(玻璃)
六方晶系
硅
薄膜
润湿
结晶学
单晶
分析化学(期刊)
化学工程
纳米技术
化学
冶金
物理化学
复合材料
海洋学
图层(电子)
色谱法
地质学
工程类
标识
DOI:10.1016/s0218-625x(00)00003-8
摘要
A new preparation is reported which, for the first time, results in a thin, crystalline SiO2 film on a Mo(112) single crystal. The procedure consists of repeated cycles of silicon deposition and subsequent oxidation, followed by a final annealing procedure. AES and XPS have been used to control film stoichiometry. LEED pictures of high contrast show a hexagonal, crystalline SiO2 overlayer with a commensurate relationship to the Mo(112) substrate. The wetting of the substrate by the film has been investigated by LEED, XPS and TDS, revealing that the film covers the substrate completely.
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