掠入射小角散射
材料科学
散射
纳米
有机太阳能电池
光学
图层(电子)
活动层
光电子学
纳米技术
聚合物
复合材料
小角中子散射
薄膜晶体管
物理
中子散射
作者
Peter Müller‐Buschbaum
标识
DOI:10.1002/adma.201304187
摘要
Grazing incidence X‐ray scattering (GIXS) provides unique insights into the morphology of active materials and thin film layers used in organic photovoltaic devices. With grazing incidence wide angle X‐ray scattering (GIWAXS) the molecular arrangement of the material is probed. GIWAXS is sensitive to the crystalline parts and allows for the determination of the crystal structure and the orientation of the crystalline regions with respect to the electrodes. With grazing incidence small angle X‐ray scattering (GISAXS) the nano‐scale structure inside the films is probed. As GISAXS is sensitive to length scales from nanometers to several hundred nanometers, all relevant length scales of organic solar cells are detectable. After an introduction to GISAXS and GIWAXS, selected examples for application of both techniques to active layer materials are reviewed. The particular focus is on conjugated polymers, such as poly(3‐hexylthiophene) (P3HT).
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