期刊:Applied Physics Letters [American Institute of Physics] 日期:1971-10-01卷期号:19 (7): 220-221被引量:4
标识
DOI:10.1063/1.1653893
摘要
The first compound whisker grown by squeeze technique (In2Bi) is reported. Rotating crystal x-ray analysis and melting-point measurements confirmed that the whiskers were In2Bi. The whisker axis coincided with the 〈001〉 direction for all four whiskers. A scanning electron microscope photograph indicates that the whiskers have diameters of a few μ and a morphology similar to tin whiskers.