All-Optoelectronic Terahertz Imaging Systems and Examples of Their Application
作者
Torsten Löffler,Karsten J. Siebert,Noboru Hasegawa,Tobias Hahn,Hartmut G. Roskos
出处
期刊:Proceedings of the IEEE [Institute of Electrical and Electronics Engineers] 日期:2007-08-01卷期号:95 (8): 1576-1582被引量:23
标识
DOI:10.1109/jproc.2007.898901
摘要
We give an overview over several all-optoelectronic measurement systems which we have developed for transmittive and reflective imaging in the terahertz (THz) frequency range. The systems employ either pulsed or continuous-wave THz radiation. In both cases, they work on the basis of single-pixel scanning. Addressing the potential for imaging in the medical and dental field, and the application of THz radiation for industrial surface and interface characterization, we explore dark-field imaging where the imaging contrast originates from diffraction and scattering effects coming from topography or refractive-index variations.