Digital Twin Approach for Fault Diagnosis in Photovoltaic Plant DC–DC Converters

This article presents a hybrid fault diagnosis framework for DC–DC converters in photovoltaic (PV) systems, combining digital twin (DT) modelling and detection with machine learning anomaly classification. The proposed method addresses both hardware faults such as open and short circuits in insulated-gate bipolar transistors (IGBTs) and diodes and sensor-level false data injection attacks (FDIAs). A five-dimensional DT architecture is employed, where a virtual entity implemented using FMI-compliant FMUs interacts with a real-time emulated physical plant. Fault detection is performed by comparing the real-time system behaviour with DT predictions, using dynamic thresholds based on power, voltage, and current sensors errors. Once a discrepancy is flagged, a second step classifier processes normalized time-series windows to identify the specific fault type. Synthetic training data are generated using emulation models under normal and faulty conditions, and feature vectors are constructed using a compact, interpretable set of statistical and spectral descriptors. The model was validated using OPAL-RT Hardware in the Loop emulations. The results show high classification accuracy, robustness to environmental fluctuations, and transferability across system configurations. The framework also demonstrates compatibility with low-cost deployment hardware, confirming its practical applicability for fault diagnosis in real-world PV systems.