纳米技术
导电体
材料科学
纳米
基质(水族馆)
表征(材料科学)
结晶度
各向异性
电导率
电阻率和电导率
电接点
光电子学
化学
复合材料
光学
物理
地质学
物理化学
海洋学
量子力学
作者
Ming‐Shui Yao,Ken‐ichi Otake,Tomoyuki Koganezawa,Moe Ogasawara,Hitoshi Asakawa,Masahiko Tsujimoto,Ziqian Xue,Yanhong Li,Nathan C. Flanders,Ping Wang,Yifan Gu,Tetsuo Honma,Shogo Kawaguchi,Yoshiki Kubota,Susumu Kitagawa
标识
DOI:10.1073/pnas.2305125120
摘要
Conductive metal-organic frameworks (cMOFs) manifest great potential in modern electrical devices due to their porous nature and the ability to conduct charges in a regular network. cMOFs applied in electrical devices normally hybridize with other materials, especially a substrate. Therefore, the precise control of the interface between cMOF and a substrate is particularly crucial. However, the unexplored interface chemistry of cMOFs makes the controlled synthesis and advanced characterization of high-quality thin films, particularly challenging. Herein, we report the development of a simplified synthesis method to grow "face-on" and "edge-on" cMOF nanofilms on substrates, and the establishment of operando characterization methodology using atomic force microscopy and X-ray, thereby demonstrating the relationship between the soft structure of surface-mounted oriented networks and their characteristic conductive functions. As a result, crystallinity of cMOF nanofilms with a thickness down to a few nanometers is obtained, the possible growth mechanisms are proposed, and the interesting anisotropic softness-dependent conducting properties (over 2 orders of magnitude change) of the cMOF are also illustrated.
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