材料科学
半导体
硅
硅带隙温度传感器
光电子学
工程物理
带隙
数码产品
带隙基准
功率半导体器件
绝缘体上的硅
电力电子
晶体管
半导体器件
宽禁带半导体
结温
电气工程
功率(物理)
纳米技术
工程类
物理
电压
量子力学
跌落电压
分压器
图层(电子)
作者
Philip G. Neudeck,Robert S. Okojie,Liang-Yü Chen
出处
期刊:Proceedings of the IEEE
[Institute of Electrical and Electronics Engineers]
日期:2002-06-01
卷期号:90 (6): 1065-1076
被引量:997
标识
DOI:10.1109/jproc.2002.1021571
摘要
The fact that wide bandgap semiconductors are capable of electronic functionality at much higher temperatures than silicon has partially fueled their development, particularly in the case of SiC. It appears unlikely that wide bandgap semiconductor devices will find much use in low-power transistor applications until the ambient temperature exceeds approximately 300/spl deg/C, as commercially available silicon and silicon-on-insulator technologies are already satisfying requirements for digital and analog VLSI in this temperature range. However practical operation of silicon power devices at ambient temperatures above 200/spl deg/C appears problematic, as self-heating at higher power levels results in high internal junction temperatures and leakages. Thus, most electronic subsystems that simultaneously require high-temperature and high-power operation will necessarily be realized using wide bandgap devices, once they become widely available. Technological challenges impeding the realization of beneficial wide bandgap high ambient temperature electronics, including material growth, contacts, and packaging, are briefly discussed.
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