纳米片
功率(物理)
分布(数学)
材料科学
计算机科学
光电子学
纳米技术
物理
数学
量子力学
数学分析
作者
Ruilong Xie,Wonhyuk Hong,Chen Zhang,Joongku Lee,Kevin Brew,Richard Johnson,Nicholas A. Lanzillo,H. Shobha,Tae‐Sun Kim,Panjae Park,Shogo Mochizuki,Iqbal Saraf,Chanro Park,Lei Zhuang,Clifford Osborn,Wai Kin Li,Feng Liu,M. Sankarapandian,Chung Ju Yang,Juntao Li
标识
DOI:10.1109/vlsitechnologyandcir46783.2024.10631449
摘要
This paper examines various approaches for integrating backside power distribution network (BSPDN) with nanosheet transistor technologies. Deep Trench Via (DTV) based BSPDN schemes, except for Shifted Frontside Via Backside Power rail (SFVBP), do not offer cell level scaling benefits, but via resistance of SFVBP could remain a bottleneck. Direct Backside Contact (DBC) based schemes offer best cell level scaling. A novel self-aligned backside contact (SABC) scheme integrated with nanosheet transistors is demonstrated with immunity to misalignments in backside contact formation. The structure exhibits good device characteristics and satisfactory reliability.
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