Structural Elucidation, Electronic and Microwave Dielectric Properties of Ca(SnxTi1–x)O3, (0 ≤ x ≤ 0.8) Lead-Free Ceramics

The lead-free Ca(Sn _x Ti_1-x )O₃, (0 ≤ x ≤ 0.8) sample has been successfully prepared through the ball milling process, sintered at 1200 °C for 3 h. The structural, morphological, vibrational, and microwave dielectric properties of synthesized samples were analyzed by X-ray diffraction (XRD), scanning electron microscopy (SEM), Fourier transform infrared spectroscopy (FT-IR), and impedance analysis. All the samples have an orthorhombic phase structure with a space group of Pbnm formation, and the crystalline size and strain changes with respect to Sn⁴⁺ doping were observed in the XRD analysis. From a morphological point of view, on increasing the content "x", the grain size reduces from 3.29 to 1.37 μm. The existence of vibrations and the bridging stretching mode of Ti-O-Ti and Ti-O-Sn both are associated with the broadband in the region below 800 cm^-1 verified by FT-IR. The variation in electrons hopping off the host compound with respect to Sn⁴⁺ ions was analyzed in AC conductivity. The changes of dielectric properties such as complex permittivity, modulus spectroscopy, and dielectric loss at room temperature with a different frequency range of 1.00-2.00 GHz are discussed.