Development of a Diamond Microfluidics-Based Intra-Chip Cooling Technology for GaN

结温 材料科学 散热片 钻石 高电子迁移率晶体管 光电子学 热阻 单片微波集成电路 微流控 热撒布器 集成电路 晶体管 传热 热的 机械工程 电气工程 纳米技术 放大器 复合材料 CMOS芯片 工程类 电压 气象学 物理 热力学
作者
David Altman,Anurag Gupta,Matthew Tyhach
标识
DOI:10.1115/ipack2015-48179
摘要

GaN on Diamond has been demonstrated to enable notable increases in RF power density without impacting High Electron Mobility Transistor (HEMT) peak junction temperature. However, Monolithic Microwave Integrated Circuits (MMICs) fabricated using GaN on Diamond substrates are subject to the same packaging thermal limitations as their GaN on SiC counterparts. Therefore, efforts to exploit GaN on Diamond to achieve substantial increases in MMIC power are stymied by external packaging thermal resistances that characterize the current “remote cooling” paradigm. This paper explores an intra-chip cooling alternative to the “remote cooling” paradigm, eliminating various heat spreader, heat sink and thermal interface layers in favor of integral microfluidic cooling in close proximity to the device junction. We describe an intra-chip cooling structure comprised of GaN on Diamond with integral micro-channels fed using a Si fluid distribution manifold. This structure exploits GaN on Diamond substrate technology to support increased HEMT areal power density while employing diamond microfluidics to affect scalable, low thermal resistance die-level heat removal. Thermal-electrical-mechanical co-design of integrated circuit (IC) features is performed to optimize conjugate heat transfer performance and manage the electrical and mechanical impacts associated with the presence of fluidic cooling near the electrically active region of the device. Through this, MMICs with significantly greater RF output than typical of the current state-of-the-art (SoA), dissipating die and HEMT heat fluxes in excess of 1 kW/cm2 and 30 kW/cm2, respectively, can be operated with junction temperatures that support reliable operation. The modeling, simulation and micro-fabrication results presented here demonstrate the potential of diamond microfluidics-based intra-chip cooling as a means to alleviate thermal impediments to exploitation of the full electromagnetic potential of GaN.
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