消光比
插入损耗
材料科学
偏振器
硅
等离子体子
光电子学
制作
光学
CMOS芯片
宽带
带宽(计算)
电信
物理
波长
计算机科学
病理
双折射
替代医学
医学
作者
Md. Ghulam Saber,David V. Plant,Nicolás Abadía
出处
期刊:AIP Advances
[American Institute of Physics]
日期:2021-04-01
卷期号:11 (4)
被引量:9
摘要
A complementary–metal–oxide semiconductor (CMOS) compatible all-silicon TM-pass polarizer using plasmonic bends is proposed. To simplify the fabrication and be compatible with the CMOS process, we employ only two materials: silicon and silicon dioxide. Highly doped silicon is used to support the plasmons. We obtain an extinction ratio and an insertion loss of 45.4 and 1.7 dB, respectively, at 1550 nm and a maximum extinction ratio of 58 dB. This is the highest reported extinction ratio for a TM-pass polarizer to the best of our knowledge. Furthermore, we achieved >20 dB of extinction ratio and <2 dB of insertion loss over 72 nm bandwidth for a device footprint <8.8 × 5.4 μm2. To achieve this, we exploit the properties of tight bends in plasmonic waveguides. Another advantage of the device is that it is robust against fabrication variations.
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