磷光
掺杂剂
降级(电信)
有机发光二极管
材料科学
极化子
共发射极
光电子学
兴奋剂
二极管
量子效率
杂质
亮度
溶解过程
光化学
化学物理
分子物理学
分子
阈值电压
图层(电子)
作者
Bomi Sim,Jong Soo Kim,Hyejin Bae,Sungho Nam,Eunsuk Kwon,Ji Whan Kim,Hwa-Young Cho,Sunghan Kim,Jang-Joo Kim
标识
DOI:10.1103/physrevapplied.14.024002
摘要
We present a comprehensive model to analyze quantitatively and predict the process of degradation of organic light-emitting diodes (OLEDs) considering all possible degradation mechanisms, i.e., polarons, excitons, exciton-polaron interactions, exciton-exciton interactions, and impurity effects. The loss of efficiency during degradation is presented as a function of quencher density. The density and generation mechanisms of quenchers are extracted using a voltage-rise model. The comprehensive model is applied to stable blue phosphorescent OLEDs, and the results show that the model describes the voltage rise and external-quantum-efficiency loss very well, and that the quenchers in the emitting layer (EML) are generated mainly by polaron-induced degradation of dopants. Quencher formation is confirmed by mass spectrometry. The polaron density per dopant molecule in the EML is reduced by controlling the emitter doping ratio, resulting in the highest reported lifetime ${\mathrm{LT}}_{50}$ of 431 h for an initial brightness of $500\phantom{\rule{0.1em}{0ex}}\mathrm{cd}/{\mathrm{m}}^{2}$ with a commission internationale de l'\'eclairage y coordinate less than 0.25, and a high external quantum efficiency greater than 18%.
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