材料科学
量子点
光电子学
二极管
聚乙烯吡咯烷酮
磷化铟
溶解
图层(电子)
铟
纳米技术
量子效率
反向漏电流
载流子
泄漏(经济)
降级(电信)
活动层
电荷(物理)
异质结
下降(电信)
作者
Jin Hong Park,Seok Hwan Jang,Jae Yeong Jeong,Ki Won Jeong,Gun woong Kim,Jun Young Kim
标识
DOI:10.1021/acsami.6c00777
摘要
Herein, a dual-interface engineering strategy that introduces polyvinylpyrrolidone (PVP) interlayers at the upper and lower interfaces of the indium phosphide (InP) quantum dot (QD) emissive layer is proposed. This strategy aims to address the critical challenges of emissive layer dissolution and charge injection imbalance in all-solution-processed inverted quantum dot light-emitting diodes (QDLEDs). The PVP interlayer at the interface with the QD/hole transport layer effectively suppresses QD dissolution during subsequent solution processing, forming a stable and homogeneous emissive layer. The underlying PVP layer at the electron transport layer/QD interface modulates the electron-hole injection balance and reduces leakage current pathways. The influence of the PVP interlayers on charge transport characteristics and surface morphology was systematically investigated via single-carrier device analysis and atomic force microscopy measurements. The incorporation of PVP interlayers considerably improves the device performance, increasing the external quantum efficiency, current efficiency, and power efficiency by ∼40%, 39%, and 63%, respectively. These findings indicate that PVP-based interface control can effectively enhance the structural stability and electrical performance of inverted InP light-emitting diodes.
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