Piezoresponse force microscopy characterization of high aspect ratio ferroelectric nanostructures

Band-excitation piezoresponse force microscopy is used to characterize the piezoelectric and ferroelectric response of high aspect ratio PbZr0.52Ti0.48O3 (PZT) nanostructures. It is found that the resonance contact frequency of the system (cantilever and sample) changed by more than 60 kHz across the sample due to variations in mechanical contact with the piezoelectrically active and inactive materials, as well as the large height variations. Probed locations on the PZT nanotubes showed enhanced intrinsic piezoelectric response and saturated piezoresponse hysteresis loops compared to off-tube locations.