Limitations on high-temperature processing of aluminum-copper metallization
作者
Arthur J. Learn
出处
期刊:Proceedings of the IEEE [Institute of Electrical and Electronics Engineers] 日期:1973-01-01卷期号:61 (4): 476-477
标识
DOI:10.1109/proc.1973.9071
摘要
Disruptive alteration of the structure of heat-treated aluminum-copper metallization either containing or contacting silicon is reported. Effects are attributed to eutectic formation in the aluminum-copper-silicon system. Processing temperatures less than 525°C are recommended for aluminum metallization containing copper.