价(化学)
材料科学
分析化学(期刊)
化学状态
硫黄
频谱分析仪
定量分析(化学)
X射线荧光
高分辨率
分辨率(逻辑)
氧化态
荧光
化学
金属
物理化学
核磁共振
冶金
X射线光电子能谱
光学
人工智能
物理
计算机科学
有机化学
地质学
色谱法
遥感
作者
Chihiro Sakai,Yukihito Nagashima
标识
DOI:10.2109/jcersj2.23130
摘要
Quantitative valence analysis of iron included in synthesized glasses has been carried out by using high-resolution X-ray fluorescence (XRF) analyzer which attached the high-resolution curved-double analyzing crystals of Si(220). The measurement results of the standard materials of Fe2+ (FeTiO3) and Fe3+ (Fe2O3) have been carefully compared for the peak analysis of provided high-resolution Fe-Kα profiles. The chemical valences (Fe2+ and Fe3+) of iron component included in the glasses have been quantitatively analyzed on the basis of multiple peak analysis of Fe-Kα (both Fe-Kα1 and Fe-Kα2). The Fe2+/Fe3+ ratio has been calculated for the glasses which were synthesized under the different oxidation–reduction conditions. Additionally, the quantitative valence analysis of sulfur has been also carried out by using high-resolution XRF analyzer which attached the analyzing crystals of Ge(111) in order to clarify the relationships with iron component. Chemical valences (S2− and S6+) of sulfur component were congruent with the chemical valence of iron component. Quantitative valence analysis by high-resolution XRF analysis has large advantages for the sample preparations, the surface analysis and the automated analysis.
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