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On the blistering of atomic layer deposited Al2O3 as Si surface passivation

材料科学 钝化 图层(电子) 分析化学(期刊) 化学 纳米技术 有机化学
作者
Bart Vermang,Hans Goverde,Anne Lorenz,A. Urueña,Guy Vereecke,Johan Meersschaut,Emanuele Cornagliotti,Aude Rothschild,J. John,Jef Poortmans,R. Mertens
出处
期刊:Conference record of the ... IEEE Photovoltaic Specialists Conference [Institute of Electrical and Electronics Engineers]
卷期号:: 003562-003567 被引量:51
标识
DOI:10.1109/pvsc.2011.6185916
摘要

This work proves that blistering is the partial delamination of a thick enough Al2O3layer caused by gaseous desorption in the Al2O3layer upon thermal treatments above a critical temperature: the Al2O3layer acts as a gas barrier and bubble formation occurs. First, using an atmospheric pressure rapid thermal processor with an atmospheric pressure ionization mass spectrometry, desorbing species upon heating of Si/Al2O3samples are identified: evident desorption peaks are observed around 400 °C for all spectra. The spectrum for m/e = 18, an indication of H2O, illustrates that gaseous desorption from Al2O3and from the Si substrate itself continues up to 600 °C and 700 °C, respectively. Also, it is shown that in the case of a 30 nm Al2O3layer, blistering starts at same annealing temperatures as gaseous desorption begins. In the case of a thin enough (2O3film, blistering does not show. To complete the proof, elastic recoil detection measurements clearly show that after annealing a thick Al2O3film above 400 °C the H content is higher near the c-Si interface as compared to the near surface. Fortunately, effective lifetime and capacitance voltage measurements show that 5 to 10 nm Al2O3layers can still be adequate passivation layers after being annealed in N2environment at temperatures up to 500-700 °C: (i) interface trap densities (Dit) can remain below 1×1011cm-2and (ii) fixed charge densities (Qf) stay negative and in the order of -3×1012cm-2Random local Al back surface field (BSF) solar cells, fabricated using a blistered film as rear surface passivation and no additional contact opening step, clearly show that random local BSFs are created upon firing of a blistered rear passivation layer covered by metal. Therefore, it is clear that blistering should be avoided, since it will reduce the overall rear surface passivation. The key to avoid blistering is using 5 to 10 nm Al2O3passivation layers and performing an annealing step prior to capping and co-firing. Al2O3/SiNxpassivated local Al BSF p-type Si solar cells are made using an out-gassing step with temperatures up to 700 °C. For these cells, the reduction in blistering and hence improvement in rear surface passivation is clearly reflected in the gain in average Voc as a function of out-gassing temperature.
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