A 0.033-mm2 21.5-aF to 114.9-aF Resolution Continuous-Time Δ Σ Capacitance-to-Digital Converter Achieving Parasitic Capacitance Immunity Up to 480 pF
符号
电容
数学
物理
算术
量子力学
电极
作者
Hyeyeon Lee,Changuk Lee,Inhee Lee,Youngcheol Chae
出处
期刊:IEEE Journal of Solid-state Circuits [Institute of Electrical and Electronics Engineers] 日期:2022-06-28卷期号:57 (10): 3048-3057被引量:7
标识
DOI:10.1109/jssc.2022.3184531
摘要
This article presents a continuous-time (CT) delta–sigma ( $\Delta \Sigma $ ) capacitance-to-digital converter (CDC) intended for use in applications with high capacitance resolution (tens of aF), and a large parasitic capacitance ${C}_{P}$ ( $>$ 400 pF). It consists of a current conveyor (CC) front-end and a CT $\Delta \Sigma $ modulator. The CC-based front-end isolates ${C}_{P}$ from the first integrator of the modulator, and the CC’s output current is directly coupled to the CT $\Delta \Sigma $ modulator. The CC uses a class-AB configuration, which enables to maintain energy efficiency and its capacitance resolution even with ${C}_{P}$ . The proposed CDC is fabricated in a 110-nm CMOS process and occupies only 0.033 mm 2 . It achieves a capacitance resolution of 21.5–59 aF with an input range of 0.2–1.5 pF. This corresponds to an effective resolution of 14.3 bits in a conversion time of 1.2 ms, while drawing only 120 $\mu \text{W}$ from a 1.5-V supply. It also achieves a capacitance resolution of 119.4 aF with ${C}_{P}$ of 480 pF, offering robust capacitance resolution with external noise interference (10 ${V}_{\text {PP}}$ ).