极紫外光刻
光学
数值孔径
平版印刷术
光圈(计算机存储器)
X射线光学
扫描仪
物理光学
物理
计算机科学
波长
X射线
声学
作者
L. Wischmeier,Paul Gräupner,Peter Kürz,Winfried Kaiser,Jan van Schoot,Jörg Mallmann,Joost de Pee,Judon Stoeldraijer
摘要
For each lithography scanner the optics is a key component. While the NXE:3400 with ZEISS Starlith®3400 optics at Numerical Aperture of 0.33 is entering high-volume manufacturing in customer factories, we are developing high NA optics with a Numerical Aperture of 0.55. This optics consists of a highly flexible illumination system and a projection optics enabling single-exposure sub 8nm half-pitch resolution. In this paper, we give an overview of the progress of ZEISS High-NA EUV program where production of first mirrors and frames has already been started.
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