宽带
材料科学
电介质
纳米棒
电阻率和电导率
光电子学
计量学
锌
半导体
纳米技术
分析化学(期刊)
光学
化学
电气工程
环境化学
物理
工程类
冶金
作者
Papa K. Amoah,Pengtao Lin,Helmut Baumgart,Rhonda Franklin,Yaw S. Obeng
标识
DOI:10.1088/1361-6463/abd3ce
摘要
Metal-oxide (MO) semiconductor gas sensors based on chemical resistivity necessarily involve making electrical contacts to the sensing materials. These contacts are imperfect and introduce errors into the measurements. In this paper, we demonstrate the feasibility of using contactless broadband dielectric spectroscopy (BDS)-based metrology in gas monitoring that avoids distortions in the reported resistivity values due to probe use, and parasitic errors (i.e. tool-measurand interactions). Specifically, we show how radio frequency propagation characteristics can be applied to study discrete processes on MO sensing material, such as zinc oxide (i.e. ZnO) surfaces, when exposed to a redox-active gas. Specifically, we have used BDS to investigate the initial oxidization of ZnO gas sensing material in air at temperatures below 200 °C, and to show that the technique affords new mechanistic insights that are inaccessible with the traditional resistance-based measurements.
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