材料科学
扫描电子显微镜
透射电子显微镜
热液循环
沉积(地质)
外延
钽
分析化学(期刊)
表面粗糙度
相(物质)
钙钛矿(结构)
化学工程
结晶学
矿物学
冶金
纳米技术
复合材料
图层(电子)
化学
有机化学
沉积物
古生物学
生物
工程类
色谱法
作者
Yuta Muto,Takahisa Shiraishi,Yoshiharu Ito,Akinori Tateyama,Hiroshi Uchida,Takanori Kiguchi,Hiroshi Funakubo,Toyohiko J. Konno
标识
DOI:10.7567/1347-4065/ab3a18
摘要
Ta substituted (K,Na)NbO3 films have been deposited at 200 °C on (001)La:SrTiO3 substrates by hydrothermal method. Film composition continuously changed with increasing the concentration of Ta2O5 in the raw material powder, and X-ray diffraction measurement showed that {001}c-oriented epitaxial (KxNa1−x)(Nb1−yTay)O3 films were obtained for all compositions. Microstructural analysis using scanning electron microscopy and transmission electron microscopy revealed that Ta-substitution made {001}c planes dominate on the surface of the film, leading to an improvement in average surface roughness. Film thickness increased with deposition time and eventually saturated. However, the saturated film thickness decreased with increasing Ta/(Nb + Ta) ratio. By evaluating the residual powders synthesized simultaneously with the films, it was found that the formation of the perovskite phase had already started in the very early stage of the deposition process, provided that Ta2O5 powder was present in the source solution.
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