Simultaneous Parametric and Functional Testing of Digital VLSI During Radiation Experiments

In the light of the improvements of integration technologies and testing instruments, an automated testing system based on state-of-the-art technical solutions for automatic test equipment is introduced. The use of PXIe-6570 in the development process of automatic test equipment is presented. Some aspects of importance when migrating to PXIe-6570 are given. Efficiency of newly developed features of PXIe-6570 is demonstrated on the introduced automated testing system. The advantage of digital pattern instruments over digital waveform instruments is presented in the comparison of the essential features of those instruments. The architecture of the project developed in Digital Pattern Editor is given. The application for conducting parametric measurements of the microcircuitry is described. It is shown that digital pattern instruments enhance the facilities of development of automated testing systems with the features of modularity, which allows to make small changes in the modules, without affecting the whole project and to customize given projects to conduct tests on various microcircuits.