X射线吸收光谱法
化学
吸收光谱法
光谱学
发射光谱
吸收(声学)
电子结构
荧光光谱法
X射线光谱学
分析化学(期刊)
荧光
光学
谱线
物理
计算化学
量子力学
色谱法
天文
作者
Hiroyuki Asakura,Tsunehiro Tanaka
出处
期刊:Chemistry Letters
[Oxford University Press]
日期:2021-04-28
卷期号:50 (5): 1075-1085
被引量:15
摘要
X-ray absorption spectroscopy (XAS) has grown as one of the essential tools to analyze electronic and geometric structure of a target element in chemistry over the course of a half-century. X-ray emission spectroscopy (XES) has also widened its appeal for decades by the virtue of advance of X-ray sources and optics. Advanced X-ray spectroscopies in combination of XAS and XES such as high-energy resolution fluorescence detection (HERFD) XAS afford a new opportunity for enhanced local electronic and geometric analysis for chemists. In this highlight review, we present a brief introduction to XAS/XES, their related techniques, applications, and beamlines in Japan. X-ray absorption and emission spectroscopy (XAS/XES) have grown as one of the essential tools for decades. In this highlight review, we describe introduction of XAS/XES, high energy resolution fluorescence detection (HERFD) XAS and resonant inelastic X-ray scattering (RIXS) which afford further understanding of electronic and geometric structure analysis for chemists.
科研通智能强力驱动
Strongly Powered by AbleSci AI