层压
材料科学
钙钛矿(结构)
粒度
制作
太阳能电池
光致发光
光电子学
卤化物
沉积(地质)
堆栈(抽象数据类型)
图层(电子)
纳米技术
复合材料
化学工程
计算机科学
沉积物
工程类
替代医学
程序设计语言
化学
无机化学
医学
生物
古生物学
病理
作者
Clare Lanaghan,Oluka Okia,Thomas Coons,Srinivas K. Yadavalli,Jack R. Palmer,Mengyao Zhang,Karrer Hersh,Moses Kodur,Orlando Trejo,Sean P. Dunfield,M.D. Thouless,David P. Fenning,Xun Huan,Neil P. Dasgupta
标识
DOI:10.1021/acsami.4c12379
摘要
Fabrication of halide perovskite (HP) solar cells typically involves the sequential deposition of multiple layers to create a device stack, which is limited by the thermal and chemical incompatibility of top contact layers with the underlying HP semiconductor. One emerging strategy to overcome these restrictions on material selection and processing conditions is lamination, where two half-stacks are independently processed and then diffusion bonded to complete the device. Lamination reduces the processing constraints on the top side of the solar cell to allow new device designs, expanded use of deposition methods, and self-encapsulation of devices. While laminated perovskite solar cells with high efficiencies and novel interlayer combinations have been demonstrated, there is a limited understanding of how the lamination process parameters affect the diffusion-bond quality and material properties of the resulting HP layer. In this study, we systematically vary temperature, pressure, and time during lamination and quantify the resulting impacts on bonded area, grain domain size, and photoluminescence. A design of experiments is performed, and statistical analysis of the experimental results is used to quantitatively evaluate the resulting process-structure-property relationships. The lamination temperature is found to be the key parameter controlling these properties. A temperature of 150 °C enables successful bonding over 95% of the substrate area and also results in increases in apparent grain domain size and photoluminescence intensity. Based on these insights, the lamination temperature of functional perovskite solar cell devices is varied, demonstrating the importance of the resulting bond quality on device performance metrics.
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