比较器
电子工程
共栅
电流镜
计算机科学
可扩展性
可靠性(半导体)
电流传感器
接口
电气工程
功率(物理)
电流(流体)
工程类
CMOS芯片
晶体管
电压
计算机硬件
物理
数据库
量子力学
放大器
作者
Saeid Karimpour,Michael Sekyere,Isaac Bruce,Emmanuel Nti Darko,Degang Chen,Colin C. McAndrew,Doug Garrity,Xiankun Jin,İ. Hatirnaz,Chen He
出处
期刊:Sensors
[Multidisciplinary Digital Publishing Institute]
日期:2024-10-22
卷期号:24 (21): 6789-6789
被引量:4
摘要
This paper introduces a systematic approach to the design of Direct Current-to-Digital Converter (DIDC) specifically engineered to overcome the limitations of traditional current measurement methodologies in System-on-Chip (SoC) designs. The proposed DIDC addresses critical challenges such as high power consumption, large area requirements, and the need for intermediate analog signals. By incorporating a current mirror in a cascode topology and managing the current across multiple binary-sized branches with the Successive Approximation Register (SAR) logic, the design achieves precise current measurement. A simple comparator, coupled with an isolation circuit, ensures accurate and reliable sensing. Fabricated using the TSMC 180 nm process, the DIDC achieves 8-bit precision without the need for nonlinearity calibration, showcasing remarkable energy efficiency with an energy per conversion of 1.52 pJ, power consumption of 117 µW, and a compact area of 0.016 mm². This innovative approach not only reduces power consumption and area, but also provides a scalable and efficient solution for next-generation semiconductor technologies. The ability to conduct online measurements during both standard operations and in-field conditions significantly enhances the performance and reliability of SoCs, making this DIDC a promising advancement in the field.
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