表面电荷
纳米技术
纳米尺度
电解质
吸附
材料科学
电荷密度
表面改性
原子力显微镜
化学
化学物理
电极
物理
量子力学
物理化学
有机化学
作者
Giada Caniglia,Gözde Tezcan,Gabriel N. Meloni,Patrick R. Unwin,Christine Kranz
标识
DOI:10.1146/annurev-anchem-121521-122615
摘要
Surface charge density and distribution play an important role in almost all interfacial processes, influencing, for example, adsorption, colloidal stability, functional material activity, electrochemical processes, corrosion, nanoparticle toxicity, and cellular processes such as signaling, absorption, and adhesion. Understanding the heterogeneity in, and distribution of, surface and interfacial charge is key to elucidating the mechanisms underlying reactivity, the stability of materials, and biophysical processes. Atomic force microscopy (AFM) and scanning ion conductance microscopy (SICM) are highly suitable for probing the material/electrolyte interface at the nanoscale through recent advances in probe design, significant instrumental (hardware and software) developments, and the evolution of multifunctional imaging protocols. Here, we assess the capability of AFM and SICM for surface charge mapping, covering the basic underpinning principles alongside experimental considerations. We illustrate and compare the use of AFM and SICM for visualizing surface and interfacial charge with examples from materials science, geochemistry, and the life sciences.
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