Schottky Contacts Regularized Linear Regression for Signal Inconsistency Circumvent in Resistive Gas Micro‐Nanosensors

Volume 5, Issue 12, December 2021, 2001194 DOI: 10.1002/smtd.202101194 Typing mistakes relevant to the understanding of the results are corrected as follows. On page 5: “However, whereas the x-intercept (− KRc) moves toward the direction in which the statistical contact resistance increases with a decline of temperature, as revealed in Figure 3a.” is corrected to “However, whereas the x-intercept (Rc) moves toward the direction in which the statistical contact resistance increases with a decline of temperature, as revealed in Figure 3a.” Caption of Figure 4: “Plots of Ra − Rg versus Ra for different metal oxides. a–c) Ra − Rg versus Ra data of the devices integrated with ZnO nanoparticles, Fe2O3 micro-blocks, and SnO2 micro-flowers, respectively. d,e) Relative surface potential (ϕ) disparities between Pt substrate and diverse semiconductors at working temperature of 300 °C. g) Variation tendency of Rc (red) and associated θ (blue) for different materials.” is corrected to “Plots of Ra − Rg versus Ra for different metal oxides. a–c) Ra − Rg versus Ra data of the devices integrated with ZnO nanoparticles, Fe2O3 micro-blocks, and SnO2 micro-flowers, respectively. d,e) Relative surface potential (ϕ) disparities between Pt substrate and diverse semiconductors at working temperature of 300 °C. f) Variation tendency of Rc (red) and associated θ (blue) for different materials.” Figure 5f2: The y-axis and x-axis label ϕB (eV) is corrected to Δϕ (eV). The corrected Figure 5 is shown below. These errors have no further ramifications on the results or conclusions in the original manuscript. The authors sincerely apologize for any inconvenience caused by this correction.