蚀刻(微加工)
各向同性腐蚀
X射线光电子能谱
材料科学
扫描电子显微镜
极性(国际关系)
制作
半导体
纳米技术
惰性
光电子学
化学工程
化学
图层(电子)
复合材料
病理
工程类
医学
生物化学
有机化学
替代医学
细胞
作者
J.L. Weyher,Dennis H. van Dorp,Thierry Conard,G. Nowak,I. Levchenko,J. J. Kelly
标识
DOI:10.1021/acs.jpcc.1c06528
摘要
Surface polarity plays a significant role in chemical etching of GaN in KOH solution, a process that is important for quality control and device fabrication. In this work, basic chemical mechanisms are proposed to explain the role of surface orientation in the chemical etching of the semiconductor. In addition, it is shown how prior photoetching of inert surfaces [the polar (0001), semipolar (101̅1̅), and nonpolar (11̅00) interfaces] enables chemical etching. Photoetching gives rise to the formation of nanocolumns on dislocations and to protrusions on nanoscale inhomogeneities. Subsequent etching in KOH solution leads to the development of distinctive features that depend on the crystal orientation of the surface and the presence of the inhomogeneities. The morphology of the photoetched surfaces was revealed by scanning electron microscopy, while X-ray photoelectron spectroscopy measurements were used to investigate the surface chemistry of these processes.
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