悬臂梁
校准
显微镜
弹簧(装置)
原子力显微镜
材料科学
非接触原子力显微镜
磁力显微镜
常量(计算机编程)
原子力声学显微镜
质量(理念)
光学
声学
纳米技术
物理
导电原子力显微镜
计算机科学
复合材料
热力学
程序设计语言
磁化
量子力学
磁场
作者
John E. Sader,James W. M. Chon,Paul Mulvaney
摘要
A method to determine the spring constant of a rectangular atomic force microscope cantilever is proposed that relies solely on the measurement of the resonant frequency and quality factor of the cantilever in fluid (typically air), and knowledge of its plan view dimensions. This method gives very good accuracy and improves upon the previous formulation by Sader et al. [Rev. Sci. Instrum. 66, 3789 (1995)] which, unlike the present method, requires knowledge of both the cantilever density and thickness.
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