材料科学
热导率
薄脆饼
之字形的
热导率测量
无定形固体
热的
纳米尺度
复合材料
光电子学
纳米技术
热力学
化学
几何学
数学
有机化学
物理
作者
Lin Qiu,Da Wei Tang,Xiudan Zheng,Guoping Su
摘要
In recent two decades, the 3ω technique has been proven to be valuable for characterizing thermophysical properties of materials from nanoscale to bulk, but some inherent deficiencies in this technique such as laborious and repeated four-pad micro strip heater/sensor deposition process and flimsiness of the micro heater/sensor limit its practical applications. Here, the authors report a novel 3ω technique, based on a freestanding sensor replacing the conventional 3ω heater/sensor adjacent to the specimen surface. A zigzag temperature response curve of the new sensor instead of the classical straight line was observed and used to extract the specimen thermal conductivity. Experimental results which excellently agree with calculation values show that the new technique is of great application value to thermal properties characterization of amorphous bulks and hundreds of microns thick wafers.
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